Test & Product Engineering of Comparators, Digital-to-Analog Converters, Analog-to-Digital Converters

• Implemented a test program using different test methods on automated testing equipment (ATE) for comparator, digital-to-analog converter (DAC), and analog-to-digital converter (ADC) chips
• Optimized testing code accounting for test accuracy-time trade-offs, utilized digital vector editors to synchronize analog and digital clocks to match the timing specifications in the datasheets
• Characterized differential nonlinearity (DNL) and integral nonlinearity (INL) for ADC chips using the histogram method and linear fit method, applied test & product engineering principles to analyze repeatability and time-yield trade-offs.